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碳材料由于其结构多样性，导致其性能多样化，因而应用领域广阔，碳材料研究已受到全球材料科学界、物理学界、化学界的广泛关注。本书系统介绍了碳材料表征技术及应用。包括X射线粉末衍射、小角X射线散射、透射电镜、扫描电子显微镜、图像分析、拉曼光谱、X射线光电子能谱、磁电阻、电化学性能、气体吸附/解吸等温线、热分析、表面官能团滴定测定、程序升温脱附技术。本书读者对象为材料领域的科技人员、研究生和高校教师。本书以英文著述，并与Elsevier出版集团合作，已在海外出版。
作者简介
作者：Michio Inagaki（日本）
Michio Inagaki教授，日本北海道大学荣休教授。担任过日本碳素学会主席，JSPS117委员会主席，Carbon杂志副主编。获得过美国和中国碳素学会、日本陶瓷学会学术贡献奖。出版8本书，发表700多篇学术论文。Feiyu Kang（康飞宇），教授，清华大学深圳研究生院院长。现任SCI刊物《Carbon》顾问编委，SCI刊物《新型炭材料》副主编，层间化合物系列国际会议（ISIC）国际顾问委员会委员。曾获国家发明奖等多项奖励。出版中英文专著5部，在国内外发表论文200多篇。
目录
List of Contributors
Preface
Acknowledgments
CHAPTER 1 Introduction.1
Michio Inagaki， Feiyu Kang
1.1 Carbon Materials.1
1.2 Characterization of Carbon Materials.3
1.3 Structure of the Present Book.5
References.6
CHAPTER 2 X—ray Powder Diffraction.7
Norio Iwashita
2.1 Introduction.7
2.2 X—ray Diffraction Pattern of Carbon Materials.8
2.3 Parameters Determined by X—ray Diffraction.10
2.4 Instrumentation.11
2.5 Specifications for Measurement.14
2.5.1 Preparation of Sample for X—ray Measurements.14
2.5.2 Measurement and Intensity Correction of Diffraction
Profiles.14
2.5.3 Correction of Diffraction Angle With Internal
Standard.16
2.5.4 Determination of Full Width at Half Maximum
Intensity.17
2.5.5 Accuracy of the Values Determined.18
2.6 Degree of Graphitization.18
2.7 Key Issues for Measurement.21
2.7.1 Diffraction Pattern.21
2.7.2 Use of Internal Standard.21
2.7.3 Use of Thin Sample Holder.22
2.7.4 Indexing the Diffraction Line.23
2.7.5 Separation into Component Profiles.23
2.8 Concluding Remarks.24
References.24
CHAPTER 3 Small—Angle X—ray Scattering.27
Katsuya Fukuyama， Yoshikiyo Hatakeyama
3.1 Introduction.27
3.2 Fundamentals.28
3.3 Key Issues for the Measurements.33
3.4 Applications for Carbon Materials.35
3.4.1 Porous Carbon Fibers.35
3.4.2 Glass—Like Carbons.36
3.4.3 Mesocellular Foam Carbons （Silica—TemplatedCarbons）.38
3.4.4 Open Pores Formed by Air Oxidation.40
3.5 Concluding Remarks.42
References.42
CHAPTER 4 Transmission Electron Microscopy.45
Sylvie Bonnamy， Agne`s Oberlin
4.1 Introduction.45
4.2 Modes of Transmission Electron Microscopy.46
4.2.1 Diffracting Mode.47
4.2.2 Imaging Modes.47
4.3 Key Issues for Observation.48
4.3.1 Object Thickness （Weak Phase Object）.48
4.3.2 Contrast Transfer Function of the Transmission
Electron Microscope.49
4.3.3 Diffusion Contrasts.54
4.3.4 Fresnel Fringes， ie， Edge Fringes.54
4.5 Applications for Carbon Materials.56
4.5.1 Transmission Electron Microscopy Modes to Study
Crystallinity of Carbon Materials.56
4.5.2 Transmission Electron Microscopy Modes in
the Study of Carbonization and Graphitization.62
4.6 Conclusions.69
References.69
Further Reading.70
CHAPTER 5 Scanning Electron Microscopy.71
Akira Yoshida， Yutaka Kaburagi， Yoshihiro Hishiyama
5.1 Introduction.71
5.2 Instrumentation and Resolving Power.72
5.2.1 Instrumentation.73
5.2.2 Magnification and Resolving Power of the
Scanning Electron Microscope.75
5.2.3 Edge Effects Appearing in SE Mode Images.76
5.3 Specimen Preparation.77
5.4 Observation With the Out—Lens Objective Lens System.79
5.5 Observation With the Snorkel Objective Lens System.81
5.6 Observation With the In—Lens System.82
5.7 Electron Channeling Effect.83
5.7.1 Electron Channeling Effect for Kish Graphite.83
5.7.2 Electron Channeling Pattern for Kish Graphite
and HOPG Specimens.86
5.7.3 Mapping and Crystal Grain Size Evaluation.88
5.8 Concluding Remarks.91
References.92
CHAPTER 6 Image Analysis.95
Kyoichi Oshida
6.1 Introduction.95
6.2 Image Analysis Methods.96
6.2.1 Process of Image Analysis.96
6.2.2 Analysis of Space Frequency.97
6.2.3 Three—Dimensional Transmission Electron
Microscopy.100
6.2.4 Software for the Analysis.100
6.3 Structure Analysis Through Transmission Electron
Microscopy.101
6.3.1 Cup—Stacked Type Carbon Nanotubes.101
6.3.2 Carbon Nanotubes Loaded With Metal Particles.104
6.3.3 Thin Graphite.108
6.3.4 Disordered Carbon.108
6.4 Texture Analysis Through Scanning Electron
Micrographs.113
6.5 Texture Analysis Through Optical Micrographs.116
6.6 Concluding Remarks.120
References.121
CHAPTER 7 Raman Spectroscopy.125
Yutaka Kaburagi， Akira Yoshida， Yoshihiro Hishiyama
7.1 Introduction.126
7.2 Fundamentals.126
7.3 Key Issues for the Measurements.129
7.3.1 Laser Probe Sampling Depth.129
7.3.2 Polarization of Laser Light.129
7.3.3 Sampling Area.131
7.3.4 Temperature.132
7.3.5 Elimination of Background Intensity.132
7.3.6 Excitation Energy Dependence of D Band.133
7.3.7 Calibration of Raman Frequency.134
7.3.8 Equipment.136
7.4 As a Measure for Structure Characterization.138
7.4.1 G Band.138
7.4.2 D and Do Bands.141
7.5 Concluding Remarks.149
References.150
……
CHAPTER 8 X—ray Photoelectron Spectroscopy.153
CHAPTER 9 Magnetoresistance.173
CHAPTER 10 Electrochemical Performance.205
CHAPTER 11 Gas Adsorption／Desorption Isotherm for Pore Structure Characterization.227
CHAPTER 12 Thermal Analysis.249
CHAPTER 13 Titration Method for the Identification of Surface Functional Groups.273
CHAPTER 14 Temperature Programmed Desorption.287
Index.307
文摘
版权页：
插图：
碳材料由于其结构多样性，导致其性能多样化，因而应用领域广阔，碳材料研究已受到全球材料科学界、物理学界、化学界的广泛关注。本书系统介绍了碳材料表征技术及应用。包括X射线粉末衍射、小角X射线散射、透射电镜、扫描电子显微镜、图像分析、拉曼光谱、X射线光电子能谱、磁电阻、电化学性能、气体吸附/解吸等温线、热分析、表面官能团滴定测定、程序升温脱附技术。本书读者对象为材料领域的科技人员、研究生和高校教师。本书以英文著述，并与Elsevier出版集团合作，已在海外出版。
作者简介
作者：Michio Inagaki（日本）
Michio Inagaki教授，日本北海道大学荣休教授。担任过日本碳素学会主席，JSPS117委员会主席，Carbon杂志副主编。获得过美国和中国碳素学会、日本陶瓷学会学术贡献奖。出版8本书，发表700多篇学术论文。Feiyu Kang（康飞宇），教授，清华大学深圳研究生院院长。现任SCI刊物《Carbon》顾问编委，SCI刊物《新型炭材料》副主编，层间化合物系列国际会议（ISIC）国际顾问委员会委员。曾获国家发明奖等多项奖励。出版中英文专著5部，在国内外发表论文200多篇。
目录
List of Contributors
Preface
Acknowledgments
CHAPTER 1 Introduction.1
Michio Inagaki， Feiyu Kang
1.1 Carbon Materials.1
1.2 Characterization of Carbon Materials.3
1.3 Structure of the Present Book.5
References.6
CHAPTER 2 X—ray Powder Diffraction.7
Norio Iwashita
2.1 Introduction.7
2.2 X—ray Diffraction Pattern of Carbon Materials.8
2.3 Parameters Determined by X—ray Diffraction.10
2.4 Instrumentation.11
2.5 Specifications for Measurement.14
2.5.1 Preparation of Sample for X—ray Measurements.14
2.5.2 Measurement and Intensity Correction of Diffraction
Profiles.14
2.5.3 Correction of Diffraction Angle With Internal
Standard.16
2.5.4 Determination of Full Width at Half Maximum
Intensity.17
2.5.5 Accuracy of the Values Determined.18
2.6 Degree of Graphitization.18
2.7 Key Issues for Measurement.21
2.7.1 Diffraction Pattern.21
2.7.2 Use of Internal Standard.21
2.7.3 Use of Thin Sample Holder.22
2.7.4 Indexing the Diffraction Line.23
2.7.5 Separation into Component Profiles.23
2.8 Concluding Remarks.24
References.24
CHAPTER 3 Small—Angle X—ray Scattering.27
Katsuya Fukuyama， Yoshikiyo Hatakeyama
3.1 Introduction.27
3.2 Fundamentals.28
3.3 Key Issues for the Measurements.33
3.4 Applications for Carbon Materials.35
3.4.1 Porous Carbon Fibers.35
3.4.2 Glass—Like Carbons.36
3.4.3 Mesocellular Foam Carbons （Silica—TemplatedCarbons）.38
3.4.4 Open Pores Formed by Air Oxidation.40
3.5 Concluding Remarks.42
References.42
CHAPTER 4 Transmission Electron Microscopy.45
Sylvie Bonnamy， Agne`s Oberlin
4.1 Introduction.45
4.2 Modes of Transmission Electron Microscopy.46
4.2.1 Diffracting Mode.47
4.2.2 Imaging Modes.47
4.3 Key Issues for Observation.48
4.3.1 Object Thickness （Weak Phase Object）.48
4.3.2 Contrast Transfer Function of the Transmission
Electron Microscope.49
4.3.3 Diffusion Contrasts.54
4.3.4 Fresnel Fringes， ie， Edge Fringes.54
4.5 Applications for Carbon Materials.56
4.5.1 Transmission Electron Microscopy Modes to Study
Crystallinity of Carbon Materials.56
4.5.2 Transmission Electron Microscopy Modes in
the Study of Carbonization and Graphitization.62
4.6 Conclusions.69
References.69
Further Reading.70
CHAPTER 5 Scanning Electron Microscopy.71
Akira Yoshida， Yutaka Kaburagi， Yoshihiro Hishiyama
5.1 Introduction.71
5.2 Instrumentation and Resolving Power.72
5.2.1 Instrumentation.73
5.2.2 Magnification and Resolving Power of the
Scanning Electron Microscope.75
5.2.3 Edge Effects Appearing in SE Mode Images.76
5.3 Specimen Preparation.77
5.4 Observation With the Out—Lens Objective Lens System.79
5.5 Observation With the Snorkel Objective Lens System.81
5.6 Observation With the In—Lens System.82
5.7 Electron Channeling Effect.83
5.7.1 Electron Channeling Effect for Kish Graphite.83
5.7.2 Electron Channeling Pattern for Kish Graphite
and HOPG Specimens.86
5.7.3 Mapping and Crystal Grain Size Evaluation.88
5.8 Concluding Remarks.91
References.92
CHAPTER 6 Image Analysis.95
Kyoichi Oshida
6.1 Introduction.95
6.2 Image Analysis Methods.96
6.2.1 Process of Image Analysis.96
6.2.2 Analysis of Space Frequency.97
6.2.3 Three—Dimensional Transmission Electron
Microscopy.100
6.2.4 Software for the Analysis.100
6.3 Structure Analysis Through Transmission Electron
Microscopy.101
6.3.1 Cup—Stacked Type Carbon Nanotubes.101
6.3.2 Carbon Nanotubes Loaded With Metal Particles.104
6.3.3 Thin Graphite.108
6.3.4 Disordered Carbon.108
6.4 Texture Analysis Through Scanning Electron
Micrographs.113
6.5 Texture Analysis Through Optical Micrographs.116
6.6 Concluding Remarks.120
References.121
CHAPTER 7 Raman Spectroscopy.125
Yutaka Kaburagi， Akira Yoshida， Yoshihiro Hishiyama
7.1 Introduction.126
7.2 Fundamentals.126
7.3 Key Issues for the Measurements.129
7.3.1 Laser Probe Sampling Depth.129
7.3.2 Polarization of Laser Light.129
7.3.3 Sampling Area.131
7.3.4 Temperature.132
7.3.5 Elimination of Background Intensity.132
7.3.6 Excitation Energy Dependence of D Band.133
7.3.7 Calibration of Raman Frequency.134
7.3.8 Equipment.136
7.4 As a Measure for Structure Characterization.138
7.4.1 G Band.138
7.4.2 D and Do Bands.141
7.5 Concluding Remarks.149
References.150
……
CHAPTER 8 X—ray Photoelectron Spectroscopy.153
CHAPTER 9 Magnetoresistance.173
CHAPTER 10 Electrochemical Performance.205
CHAPTER 11 Gas Adsorption／Desorption Isotherm for Pore Structure Characterization.227
CHAPTER 12 Thermal Analysis.249
CHAPTER 13 Titration Method for the Identification of Surface Functional Groups.273
CHAPTER 14 Temperature Programmed Desorption.287
Index.307
文摘
版权页：
插图：
| ISBN | 9787302471585 |
|---|---|
| 出版社 | 清华大学出版社 |
| 作者 | 稻垣道夫 |
| 尺寸 | 16 |